test_overflow: Regularize test reporting output

Report test run summaries more regularly, so it's easier to understand
the output:
- Remove noisy "ok" reports for shift and allocator tests.
- Reorganize per-type output to the end of each type's tests.
- Replace redundant vmalloc tests with __vmalloc so that __GFP_NO_WARN
  can be used to keep the expected failure warnings out of dmesg,
  similar to commit 8e060c2 ("lib/test_overflow.c: avoid tainting
  the kernel and fix wrap size")

Resulting output:

  test_overflow: 18 u8 arithmetic tests finished
  test_overflow: 19 s8 arithmetic tests finished
  test_overflow: 17 u16 arithmetic tests finished
  test_overflow: 17 s16 arithmetic tests finished
  test_overflow: 17 u32 arithmetic tests finished
  test_overflow: 17 s32 arithmetic tests finished
  test_overflow: 17 u64 arithmetic tests finished
  test_overflow: 21 s64 arithmetic tests finished
  test_overflow: 113 shift tests finished
  test_overflow: 17 overflow size helper tests finished
  test_overflow: 11 allocation overflow tests finished
  test_overflow: all tests passed

Acked-by: Rasmus Villemoes <linux@rasmusvillemoes.dk>
Link: https://lore.kernel.org/all/eb6d02ae-e2ed-e7bd-c700-8a6d004d84ce@rasmusvillemoes.dk/
Reviewed-by: Nick Desaulniers <ndesaulniers@google.com>
Link: https://lore.kernel.org/all/CAKwvOdnYYa+72VhtJ4ug=SJVFn7w+n7Th+hKYE87BRDt4hvqOg@mail.gmail.com/
Signed-off-by: Kees Cook <keescook@chromium.org>

Author: kees

lib/test_overflow.c

@@ -252,10 +252,10 @@ static int __init test_ ## t ## _overflow(void) {			\
 	int err = 0;							\
 	unsigned i;							\
 									\
-	pr_info("%-3s: %zu arithmetic tests\n", #t,			\
-		ARRAY_SIZE(t ## _tests));				\
 	for (i = 0; i < ARRAY_SIZE(t ## _tests); ++i)			\
 		err |= do_test_ ## t(&t ## _tests[i]);			\
+	pr_info("%zu %s arithmetic tests finished\n",			\
+		ARRAY_SIZE(t ## _tests), #t);				\
 	return err;							\
 }
 
@@ -291,6 +291,7 @@ static int __init test_overflow_calculation(void)
 static int __init test_overflow_shift(void)
 {
 	int err = 0;
+	int count = 0;
 
 /* Args are: value, shift, type, expected result, overflow expected */
 #define TEST_ONE_SHIFT(a, s, t, expect, of) ({				\
@@ -313,9 +314,7 @@ static int __init test_overflow_shift(void)
 			pr_warn("got %llu\n", (u64)__d);		\
 		__failed = 1;						\
 	}								\
-	if (!__failed)							\
-		pr_info("ok: (%s)(%s << %s) == %s\n", #t, #a, #s,	\
-			of ? "overflow" : #expect);			\
+	count++;							\
 	__failed;							\
 })
 
@@ -479,6 +478,10 @@ static int __init test_overflow_shift(void)
 	err |= TEST_ONE_SHIFT(0, 31, s32, 0, false);
 	err |= TEST_ONE_SHIFT(0, 63, s64, 0, false);
 
+	pr_info("%d shift tests finished\n", count);
+
+#undef TEST_ONE_SHIFT
+
 	return err;
 }
 
@@ -530,7 +533,6 @@ static int __init test_ ## func (void *arg)				\
 		free ## want_arg (free_func, arg, ptr);			\
 		return 1;						\
 	}								\
-	pr_info(#func " detected saturation\n");			\
 	return 0;							\
 }
 
@@ -544,10 +546,7 @@ DEFINE_TEST_ALLOC(kmalloc,	 kfree,	     0, 1, 0);
 DEFINE_TEST_ALLOC(kmalloc_node,	 kfree,	     0, 1, 1);
 DEFINE_TEST_ALLOC(kzalloc,	 kfree,	     0, 1, 0);
 DEFINE_TEST_ALLOC(kzalloc_node,  kfree,	     0, 1, 1);
-DEFINE_TEST_ALLOC(vmalloc,	 vfree,	     0, 0, 0);
-DEFINE_TEST_ALLOC(vmalloc_node,  vfree,	     0, 0, 1);
-DEFINE_TEST_ALLOC(vzalloc,	 vfree,	     0, 0, 0);
-DEFINE_TEST_ALLOC(vzalloc_node,  vfree,	     0, 0, 1);
+DEFINE_TEST_ALLOC(__vmalloc,	 vfree,	     0, 1, 0);
 DEFINE_TEST_ALLOC(kvmalloc,	 kvfree,     0, 1, 0);
 DEFINE_TEST_ALLOC(kvmalloc_node, kvfree,     0, 1, 1);
 DEFINE_TEST_ALLOC(kvzalloc,	 kvfree,     0, 1, 0);
@@ -559,32 +558,39 @@ static int __init test_overflow_allocation(void)
 {
 	const char device_name[] = "overflow-test";
 	struct device *dev;
+	int count = 0;
 	int err = 0;
 
+#define check_allocation_overflow(alloc)	({	\
+	count++;					\
+	test_ ## alloc(dev);				\
+})
+
 	/* Create dummy device for devm_kmalloc()-family tests. */
 	dev = root_device_register(device_name);
 	if (IS_ERR(dev)) {
 		pr_warn("Cannot register test device\n");
 		return 1;
 	}
 
-	err |= test_kmalloc(NULL);
-	err |= test_kmalloc_node(NULL);
-	err |= test_kzalloc(NULL);
-	err |= test_kzalloc_node(NULL);
-	err |= test_kvmalloc(NULL);
-	err |= test_kvmalloc_node(NULL);
-	err |= test_kvzalloc(NULL);
-	err |= test_kvzalloc_node(NULL);
-	err |= test_vmalloc(NULL);
-	err |= test_vmalloc_node(NULL);
-	err |= test_vzalloc(NULL);
-	err |= test_vzalloc_node(NULL);
-	err |= test_devm_kmalloc(dev);
-	err |= test_devm_kzalloc(dev);
+	err |= check_allocation_overflow(kmalloc);
+	err |= check_allocation_overflow(kmalloc_node);
+	err |= check_allocation_overflow(kzalloc);
+	err |= check_allocation_overflow(kzalloc_node);
+	err |= check_allocation_overflow(__vmalloc);
+	err |= check_allocation_overflow(kvmalloc);
+	err |= check_allocation_overflow(kvmalloc_node);
+	err |= check_allocation_overflow(kvzalloc);
+	err |= check_allocation_overflow(kvzalloc_node);
+	err |= check_allocation_overflow(devm_kmalloc);
+	err |= check_allocation_overflow(devm_kzalloc);
 
 	device_unregister(dev);
 
+	pr_info("%d allocation overflow tests finished\n", count);
+
+#undef check_allocation_overflow
+
 	return err;
 }